DS/EN 60749-2:2003
Semiconductor Devices - Mechanical and climatic test methods - Part 2: Low air pressure

Standard No.

DS/EN 60749-2:2003

Release Date

2003

Published By

Danish Standards Foundation

Status

Be replaced 2003-12

Replace By

DS/EN 60749-2/Corr.1:2004

Latest

DS/EN 60749-2/Corr.1:2004

Scope

This part of IEC 60749 covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures. This test is only applicable to devices where the operating voltage exceeds 1000 V.

DS/EN 60749-2:2003 history

• 2004 DS/EN 60749-2/Corr.1:2004 Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
• 2003 DS/EN 60749-2:2003 Semiconductor Devices - Mechanical and climatic test methods - Part 2: Low air pressure