DS/EN 60444-2:1998
Measurement of quartz crystal unit parameters by zero phase technique in a PI-Network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Standard No.

DS/EN 60444-2:1998

Release Date

1998

Published By

Danish Standards Foundation

Latest

DS/EN 60444-2:1998

Scope

This standard describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%. The advantage of this method is that it uses only the measuring circuit described in IEC Publication 444 and therefore avoids the use of additional elements or instruments which could be sources of error.

DS/EN 60444-2:1998 history

• 1998 DS/EN 60444-2:1998 Measurement of quartz crystal unit parameters by zero phase technique in a PI-Network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units