This part of 60444 describes two methods for determining the spurious (unwanted) modes of piezoelectric crystal resonators. It extends the capabilities and improves the reproducibility and accuracy compared to previous methods.The previous methods described in IEC 60283 (1968) were based on the use of a measuring bridge, which applies to non-traceable components such as variable resistors and a hybrid transformer, which are no longer commercially available.Method A (Full parameter determination)Full parameter determination allows the determination of the equivalent parameters of the spurious resonances and is based on the methods described in 60444-5 using
DS/EN 60444-9:2007 history
2007DS/EN 60444-9:2007 Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units