This specification describes the equipment and procedures to be used for the inspection of electronic components by means of radiography and radioscopy. When the X-ray inspection is prescribed in a detail or component specification, specific accept/reject criteria should be prescribed either directly or by reference to an appropriate higher order specification (e.g. generic or Technology Approval Schedule - TAS).
DS/EN 100012:1995 history
1995DS/EN 100012:1995 Basic Specification: X-ray inspection of electronic components