IEC 61671:2012
Automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML

Standard No.
IEC 61671:2012
Release Date
2012
Published By
International Electrotechnical Commission (IEC)
Latest
IEC 61671:2012
Replace
IEC 93/323/FDIS:2011
Scope
ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data@ resource data@ diagnostic data@ and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards. Purpose The purpose of ATML is to support TP@ test asset@ and UUT interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT@ test@ and diagnostic information between components of the test system. The purpose of this standard is to provide an overview of ATML goals@ define the ATML family of standards@ and specify common data elements for the ATML family of standards.

IEC 61671:2012 history

  • 2012 IEC 61671:2012 Automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
Automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML



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