International Organization for Standardization (ISO)
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ISO 18116:2005
Scope
This International Standard gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.
ISO 18116:2005 Referenced Document
ISO 18115 Surface chemical analysis - Vocabulary; Amndment 2*, 2007-12-01 Update
ISO 18116:2005 history
2005ISO 18116:2005 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis