This PAS specifies the measurement methods for the reflectivity of electromagnetic wave absorbers (EMA) for the normal incident, oblique incident and each polarized wave in the frequency range from 30 GHz to 300 GHz. In addition, these methods are also equally effective for the reflectivity measurement of other materials.
This PAS is applicable not only to those EMA which are widely used as the counter-measures against communication faults, radio interference etc., but also to those used in an anechoic chamber in some cases. EMAs may be any kind of material and may have any arbitrary shape, configuration, or layered structure as indicated below.
Material: Conductive material, dielectric material, magnetic material
Shape: Planar, pyramidal-type, wedge-type, etc.
Layer structure: Single layer, multi layers, and graded-index material
This PAS may give the measurement method of reflectivity applicable to various EMAs or materials. However, it may not be applicable to all EMAs.
This PAS may be supplemented with additional methods if necessary so that a future demand may be fulfilled.
The PAS specifies the measurement methods for the reflectivity of EMA in the millimetre-wave range:
- measurement frequency range: 30 GHz to 300 GHz
- reflectivity: 0 to -50 dB
- incident angle: 0° to 80°.
IEC PAS 62431:2005 history
2005IEC PAS 62431:2005 Measurement methods for reflectivity of electromagnetic wave absorbers in millimetre wave frequency
IEC PAS 62431:2005 Measurement methods for reflectivity of electromagnetic wave absorbers in millimetre wave frequency was changed to IEC 62431:2008 Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods.