DIN EN 60749-30:2011
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005 + A1:2011); German version EN 60749-30:2005 + A1:2011
- Standard No.
- DIN EN 60749-30:2011
- Release Date
- 2011
- Published By
- German Institute for Standardization
- Latest
- DIN EN 60749-30:2011
- Replace
- DIN EN 60749-30:2005 DIN EN 60749-30/A1:2009
DIN EN 60749-30:2011 history
- 2011 DIN EN 60749-30:2011 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005 + A1:2011); German version EN 60749-30:2005 + A1:2011
- 0000 DIN EN 60749-30/A1:2009
- 0000 DIN EN 60749-30:2005
