GB/T 2689.3-1981
Life test and acceleration life test--Simple linear deflection-free evaluation of Weibull distributions (English Version)

Standard No.: GB/T 2689.3-1981
Language: Chinese, Available in English version
Release Date: 1981
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 2689.3-1981

Scope: This standard specifies procedures and methods for simple linear unbiased estimation methods for constant stress life tests and accelerated life tests. It is suitable for electronic component products (hereinafter referred to as products) whose life obeys the Weibull distribution, its shape parameter m>0, characteristic life η>0, position parameter γ=0, and the number of test samples in each group is a fixed number of n>25 Data processing for censored life testing and accelerated life testing.

GB/T 2689.3-1981 history

1981 GB/T 2689.3-1981 Life test and acceleration life test--Simple linear deflection-free evaluation of Weibull distributions