GOST R 8.716-2010
State system for ensuring the uniformity of measurements. Reflectometers of the extreme ultraviolet radiation for measurements of the characteristics of multilayer nanostructures in the wavelength range 10 to 30 nm. Measurement procedure

Standard No.

GOST R 8.716-2010

Release Date

2010

Published By

RU-GOST R

Latest

GOST R 8.716-2010

GOST R 8.716-2010 Referenced Document

• GOST 8.197-2005 State system for ensuring the uniformity of measurements. State verification scheme for instruments measuring of the spectral radiance in spectral range from 0,04 to 0,25 ?
• GOST 8.207-1976 State system for ensuring the uniformity of measurements. Direct measurements with multiple observations. Methods of processing the results of observations. Basic principles
• GOST 8.552-2001 State system for ensuring the uniformity of measurements. State verification scheme for instruments measuring the radiant flux and irradiance in spectral range from 0.03 to 0.40 mcm

GOST R 8.716-2010 history

• 2010 GOST R 8.716-2010 State system for ensuring the uniformity of measurements. Reflectometers of the extreme ultraviolet radiation for measurements of the characteristics of multilayer nanostructures in the wavelength range 10 to 30 nm. Measurement procedure