This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated
circuits.
This test is classified as destructive.
The purpose of this test is to establish a method for determining integrated circuit (IC) latchup
characteristics and to define latch-up failure criteria. Latch-up characteristics are used in
determining product reliability and minimizing "no trouble found" (NTF) and "electrical
overstress" (EOS) failures due to latch-up.
This test method is primarily applicable to CMOS devices. Applicability to other technologies
must be established.
The classification of latch-up as a function of temperature is defined in 3.1 and the failure
level criteria are defined in 3.2
BS EN 60749-29:2011 history
2011BS EN 60749-29:2011 Semiconductor devices. Mechanical and climatic test methods. Latch-up test
2004BS EN 60749-29:2003 Semiconductor devices - Mechanical and climatic test methods - Part 29:Latch-up test