IEC 61967-8:2011
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

Standard No.
IEC 61967-8:2011
Release Date
2011
Published By
International Electrotechnical Commission (IEC)
Status
Replace By
IEC 61967-8:2023 RLV
Latest
IEC 61967-8:2023 RLV
Replace
IEC 47A/868/FDIS:2011
Scope
The measurement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.

IEC 61967-8:2011 history

  • 0000 IEC 61967-8:2023 RLV
  • 2011 IEC 61967-8:2011 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method



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