2011BS EN 60749-15:2011 Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices
2011BS EN 60749-15:2010 Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices
2003BS EN 60749-15:2003 Semiconductor devices - Mechanical and climatic test methods - Resistance to soldering temperature for through-hole mounted devices