BS IEC 60747-10:1991
Semiconductor devices. Generic specification for discrete devices and integrated circuits

Standard No.

BS IEC 60747-10:1991

Release Date

1991

Published By

British Standards Institution (BSI)

Status

Be replaced

Replace By

BS IEC 60747-10:1991(2011)

Latest

BS IEC 60747-10:1991(2011)

Replace

86/24762 DC:1986 BS 9970 Pt.0:1985 BS 9450:1998

BS IEC 60747-10:1991 history

• 0000 BS IEC 60747-10:1991(2011)
• 1998 BS 9450:1998 Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test
• 1991 BS IEC 60747-10:1991 Semiconductor devices. Generic specification for discrete devices and integrated circuits
• 1975 BS 9450:1975 Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test

BS IEC 60747-10:1991 Semiconductor devices. Generic specification for discrete devices and integrated circuits has been changed from BS 9450:1998 Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test.