BS EN 60749-32:2003+A1:2010 Semiconductor devices. Mechanical and climatic test methods. Flammability of plastic-encapsulated devices (externally induced)
2003BS EN 60749-32:2003+A1:2010 Semiconductor devices. Mechanical and climatic test methods. Flammability of plastic-encapsulated devices (externally induced)
2003BS EN 60749-32:2003 Semiconductor devices - Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (externally induced)