National Metrological Technical Specifications of the People's Republic of China
Latest
JJF 1236-2010
Scope
This specification applies to the calibration of semiconductor tube characteristic graphical instruments (hereinafter referred to as graphical instruments) with plug-in units or accessory devices.
JJF 1236-2010 history
2010JJF 1236-2010 Calibration Specification for Semiconductor Device Curve Tracers