JJF 1236-2010
Calibration Specification for Semiconductor Device Curve Tracers (English Version)

Standard No.
JJF 1236-2010
Language
Chinese, Available in English version
Release Date
2010
Published By
National Metrological Technical Specifications of the People's Republic of China
Latest
JJF 1236-2010
Scope
This specification applies to the calibration of semiconductor tube characteristic graphical instruments (hereinafter referred to as graphical instruments) with plug-in units or accessory devices.

JJF 1236-2010 history

  • 2010 JJF 1236-2010 Calibration Specification for Semiconductor Device Curve Tracers
  • 1970 JJF 1236-1990 1×105 Cattle benchmark dynamometer operation technical specification
Calibration Specification for Semiconductor Device Curve Tracers



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