BS EN 62415:2010
Semiconductor devices - Constant current electromigration test
- Standard No.
- BS EN 62415:2010
- Release Date
- 2010
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN 62415:2010
- Scope
- This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
BS EN 62415:2010 history
- 2010 BS EN 62415:2010 Semiconductor devices - Constant current electromigration test
