This part of IEC 61000 defines test methods for immunity to ripple at the d.c. input power port
of electrical or electronic equipment.
This standard is applicable to low-voltage d.c. power ports of equipment supplied by external
rectifier systems, or batteries which are being charged.
The object of this standard is to establish a common and reproducible basis for testing, in a
laboratory, electrical and electronic equipment when subjected to ripple voltages such as those
generated by rectifier systems and/or auxiliary service battery chargers overlaying on d.c.
power supply sources.
This standard defines
– test voltage waveform;
– range of test levels;
– test generator;
– test set-up;
– test procedure.
The test described hereafter applies to electrical or electronic equipment and systems. It also
applies to modules or subsystems whenever the equipment under test (EUT) rated power is
greater than the test generator capacity specified in clause 6.
This test does not apply to equipment connected to battery charger systems incorporating
switch mode converters.
This standard does not specify the tests to be applied to particular apparatus or systems. Its
main aim is to give a general basic reference to IEC product committees. These product
committees (or users or manufacturers of equipment) remain responsible for the appropriate
choice of the test and the severity level to be applied to their equipment.
Dedicated test procedures are in use for testing specific categories of electrical or electronic
equipment, e.g. equipment connected to d.c. supply network of telephone switching centres;
the related product committees should evaluate the relevance and applicability of the test
procedure specified in this basic standard.
BS EN 61000-4-17:1999+A2:2009 history
1999BS EN 61000-4-17:1999+A2:2009 Electromagnetic compatibility (EMC). Testing and measurement techniques. Ripple on d.c. input power port immunity test
1999BS EN 61000-4-17:1999 Electromagnetic compatibility (EMC) - Testing and measurement techniques - Ripple on d.c. input power port immunity test