IEC 62415:2010
Semiconductor devices - Constant current electromigration test
- Standard No.
- IEC 62415:2010
- Release Date
- 2010
- Published By
- International Electrotechnical Commission (IEC)
- Latest
- IEC 62415:2010
- Scope
- This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
IEC 62415:2010 history
- 2010 IEC 62415:2010 Semiconductor devices - Constant current electromigration test
