JIS C 5402-5-2:2005 Connectors for electronic equipment -- Tests and measurements -- Part 5-2: Current-carrying capacity tests -- Test 5b: Current-temperature derating
This standard specifies test methods for evaluating the current capacity of electronic equipment connectors (hereinafter referred to as connectors) under high ambient temperatures.
JIS C 5402-5-2:2005 history
2005JIS C 5402-5-2:2005 Connectors for electronic equipment -- Tests and measurements -- Part 5-2: Current-carrying capacity tests -- Test 5b: Current-temperature derating