GOST 20398.6-1974
Field-effect transistors. Gate leakage current measurement technique

Standard No.

GOST 20398.6-1974

Release Date

1974

Published By

RU-GOST R

Latest

GOST 20398.6-1974

Scope

This standard applies to field-effect transistors and establishes a method for measuring gate leakage current IZ.ut

GOST 20398.6-1974 history

• 1974 GOST 20398.6-1974 Field-effect transistors. Gate leakage current measurement technique