GOST 19834.0-1975
Semiconductor emitters. Methods for measurement of parameters. General principles

Standard No.

GOST 19834.0-1975

Release Date

1975

Published By

RU-GOST R

Latest

GOST 19834.0-1975

Scope

This standard applies to semiconductor emitters and establishes provisions common to standards for measurement methods.

GOST 19834.0-1975 Referenced Document

• GOST 12.0.004-1979 System of occupational safety standards. Organization of occupational safety training for workers. General provisions
• GOST 12.1.030-1981 Occupational safety standards system. Electric safety. Protective condactive earth, neutralling*， 1981-04-19 Update
• GOST 12.2.007.0-1975 Occupation safety standards system. Electrical equipment. General safety requirements
• GOST 12.3.019-1980 Occupational safety standards system. Electrical tests and measurements. General safety requirements*， 1980-04-19 Update
• GOST 18986.1-1973 Semiconductor diodes. Method for measuring direct reverse current
• GOST 18986.3-1973 Semiconductor diodes. Method of measuring of direct forward voltage and direct forward current
• GOST 20.57.406-1981 Complex quality control system. Electronic, quantum electronic and electrotechnical components. Test methods*， 1981-04-19 Update
• GOST 8.023-1986 State system for ensuring the uniformity of measurements. State primary standard and all-union verification schedule for means measuring light parameters*， 1986-04-19 Update

GOST 19834.0-1975 history

• 1975 GOST 19834.0-1975 Semiconductor emitters. Methods for measurement of parameters. General principles