GOST 18986.7-1973
Semiconductor diodes. Methods for measuring life time

Standard No.

GOST 18986.7-1973

Release Date

1973

Published By

RU-GOST R

Latest

GOST 18986.7-1973

GOST 18986.7-1973 Referenced Document

• GOST 18986.0-1974 Semiconductor diodes. Measuring methods for electrical parameters. General requirements*， 1974-12-22 Update
• GOST 18986.6-1973 Semiconductor diodes. Method for measuring recovery charge
• GOST 19656.0-1974 Semiconductor UHF diodes. Measurement methods of electrical parameters. General conditions*， 1974-12-22 Update

GOST 18986.7-1973 history

• 1973 GOST 18986.7-1973 Semiconductor diodes. Methods for measuring life time