JIS C 5005-2:2010
Quality assessment systems -- Part 2: Selection and use of sampling plans for inspection of electronic components and packages

Standard No.

JIS C 5005-2:2010

Release Date

2010

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS C 5005-2:2010

JIS C 5005-2:2010 Referenced Document

• IEC 60194 Printed board design, manufacture and assembly - Terms and definitions*， 2015-04-01 Update
• JIS Z 8101-2 Statistics -- Vocabulary and symbols -- Part 2: Applied statistics*， 2015-10-20 Update
• JIS Z 9015-1:2006 Sampling procedures for inspection by attributes -- Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection

JIS C 5005-2:2010 history

• 2010 JIS C 5005-2:2010 Quality assessment systems -- Part 2: Selection and use of sampling plans for inspection of electronic components and packages