BS EN 62433-2:2010
EMC IC modelling - Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

Standard No.

BS EN 62433-2:2010

Release Date

2010

Published By

British Standards Institution (BSI)

Status

Be replaced

Replace By

BS EN 62433-2:2017

Latest

BS EN 62433-2:2017

Replace

07/30163156 DC-2007

Scope

This part of IEC 62433 specifies macro-models for ICs to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE model can also be used for modelling an IC-die, a functional block and an Intellectual Property block (IP). The ICEM-CE model can be used to model both digital and analogue ICs.

BS EN 62433-2:2010 Referenced Document

• IEC 61967 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method*， 2023-05-03 Update
• IEC 61967-4 Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method*， 2021-03-16 Update

BS EN 62433-2:2010 history

• 2017 BS EN 62433-2:2017 EMC IC modelling. Models of integrated circuits for EMI behavioural simulation. Conducted emissions modelling (ICEM-CE)
• 2010 BS EN 62433-2:2010 EMC IC modelling - Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)