SJ/T 11403-2009 (English Version) PDF

Scope: This standard applies to the reliability assessment of laser diode modules for optical communications.

SJ/T 11403-2009 Referenced Document

GB/T 15651-1995 Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic devices
GB/T 17573-1998 Semiconductor devices. Discrete devices and integrated circuits. Part 1: General
GB/T 18904.2-2002 Semiconductor devices-Part 12-2: Optoelectronic devices-Blank detail specification for laser diodes modules with pigtail for fiber optic systems or sub-systems
GB/T 2423.1-2008 Environmental testing for electric and electronic products.Part 2:Test methods.Tests A:Cold
GB/T 2423.10-2008 Environmental testing for electric and electronic products.Part 2:Tests methods Test Fc:Vibration(sinusoidal)
GB/T 2423.2-2008 Environmental testing for electric and electronic products.Part 2:Test methods.Tests B:Dry heat
GB/T 2423.22-2002 Environmental testing for electric and electronic products--Part 2: Test methods Test N: Change of temperature
GB/T 2423.23-1995 Environmental testing for electric and electronic proucts. Test Q: Sealing
GB/T 2423.3-2006 Environmental testing for electric and electronic products-Part 2:Tesing method-Test Cab：Damp heat,steady state
GJB 128A-1997 Semiconductor discrete device test methods
GJB 548A-1996 Microelectronic device test methods and procedures
GJB 915A-1997 Fiber Optics Test Methods

2009 SJ/T 11403-2009 Laser diode modules used for telecommunication.Reliability assessment