SJ/T 11399-2009
Measurement methods for chips of light emitting diodes (English Version)

Standard No.

SJ/T 11399-2009

Language

Chinese, Available in English version

Release Date

2009

Published By

Professional Standard - Electron

Latest

SJ/T 11399-2009

Scope

This standard specifies the test methods for radiometric, photometric, colorimetric, electrical, thermal parameters and electromagnetic compatibility of semiconductor light-emitting diode chips. This standard applies to visible light semiconductor light-emitting diode chips. The testing of ultraviolet and infrared light-emitting diode chips and epitaxial wafers can be performed as a reference.

SJ/T 11399-2009 Referenced Document

• GB/T 11499-2001 Letter symbols for discrete semiconductor devices
• GB/T 15651-1995 Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic devices
• GB/T 5698-2001 Glossary of color terms
• SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes

SJ/T 11399-2009 history

• 2009 SJ/T 11399-2009 Measurement methods for chips of light emitting diodes