SANS 9455-17:2009
Soft soldering fluxes - Test methods Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues

Standard No.

SANS 9455-17:2009

Release Date

2009

Published By

ZA-SANS

Latest

SANS 9455-17:2009

Scope

Specifies a method for deleterious effects that may arise from flux residues after soldering or tinning test coupons.

SANS 9455-17:2009 history

• 2009 SANS 9455-17:2009 Soft soldering fluxes - Test methods Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues