SANS 61000-4-20:2007 Electromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Describes emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. Does not specify tests to be applied to any particular apparatus or system(s).
SANS 61000-4-20:2007 history
2007SANS 61000-4-20:2007 Electromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides