IEEE 1671.5-2008
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Adapter Information

Standard No.

IEEE 1671.5-2008

Release Date

2008

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Status

Be replaced

Replace By

IEEE 1671.5-2015

Latest

IEEE 1671.5-2015

Scope

The scope of this trial-use standard is the definition of an exchange format, utilizing XML, for exchanging the test adapter information by defining the interface between the UUT and the test station, which includes the description of the test adapter (e.g., physical and electrical characteristics, capabilities/performance, and identification/classification).

IEEE 1671.5-2008 history

• 2015 IEEE 1671.5-2015 Automatic Test Markup Language (ATML) Test Adapter Description
• 2008 IEEE 1671.5-2008 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Adapter Information