ANSI/IEEE 1620:2008
Standard for Test Methods for the Characterization of Organic Transistors and Materials

Standard No.

ANSI/IEEE 1620:2008

Release Date

2008

Published By

American National Standards Institute （ANSI)

Latest

ANSI/IEEE 1620:2008

Scope

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

ANSI/IEEE 1620:2008 history

• 2008 ANSI/IEEE 1620:2008 Standard for Test Methods for the Characterization of Organic Transistors and Materials