This standard applies to general methods for measuring elemental composition and elemental content in various materials using wavelength dispersive X-ray fluorescence spectrometers. It can analyze all elements between F and U, and is particularly effective for the determination of non-metallic elements Si, P, As, S, Se, Te, F, Cl, Br, I, and At. The mass fraction range of the analyzed elements is μg/g~100%.
JY/T 016-1996 history
2020JY/T 0569-2020 General rules for wavelength dispersive X-ray fluorescence spectrometry
1997JY/T 016-1996 General rules for wavelength dispersive X-ray fluorescence spectrometry