EN 60749-31:2003 Semiconductor devices - Mechanical and climatic test methods Part 31: Flammability of plastic-encapsulated devices (internally induced)
European Committee for Electrotechnical Standardization（CENELEC）
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2003EN 60749-31:2003 Semiconductor devices - Mechanical and climatic test methods Part 31: Flammability of plastic-encapsulated devices (internally induced)