EN 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Incorporates Amendment A1: 2012)

Standard No.

EN 60749-27:2006

Release Date

2006

Published By

European Committee for Electrotechnical Standardization（CENELEC）

Latest

EN 60749-27:2006

EN 60749-27:2006 history

• 2006 EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Incorporates Amendment A1: 2012)