BS EN 61967-6:2002+A1:2008 PDF

Scope: This part of the IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. This method is applicable to the measurement of a single IC or a chip set of ICs on the standardized test board for characterization and comparison purposes. It is also usable to evaluate the electromagnetic characteristics of an IC or group of ICs on an actual application PCB for emission reduction purposes. This method is called the "magnetic probe method".

BS EN 61967-6:2002+A1:2008 Referenced Document

IEC 61967-1 Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions*， 2018-12-12 Update
IEC 61967-4 Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method*， 2021-03-16 Update

2002 BS EN 61967-6:2002+A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -Part 6: Measurement of conducted emissions - Magnetic probe method
2002 BS EN 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Measurement of conducted emissions - Magnetic probe method