EN 60749-16:2003
Semiconductor devices Mechanical and climatic test methods Part 16: Particle impact noise detection (PIND)

Standard No.

EN 60749-16:2003

Release Date

2003

Published By

European Committee for Electrotechnical Standardization（CENELEC）

Latest

EN 60749-16:2003

EN 60749-16:2003 history

• 2003 EN 60749-16:2003 Semiconductor devices Mechanical and climatic test methods Part 16: Particle impact noise detection (PIND)