DIN EN 61967-6:2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008
- Standard No.
- DIN EN 61967-6:2008
- Release Date
- 2008
- Published By
- German Institute for Standardization
- Status
- Replace By
- DIN EN 61967-6:2008-10
- Latest
- DIN EN 61967-6 Berichtigung 1:2011-02
- Replace
- DIN IEC 61967-6/A1:2005
DIN EN 61967-6:2008 Referenced Document
- IEC 61967-1 Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions*， 2018-12-12 Update
- IEC 61967-4 Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method*， 2021-03-16 Update
DIN EN 61967-6:2008 history
- 2011 DIN EN 61967-6 Berichtigung 1:2011-02 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:...
- 2011 DIN EN 61967-6 Berichtigung 1:2011 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:200
- 2008 DIN EN 61967-6:2008-10 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008 / Note: DIN EN 61967-6 (2003-05...
- 2008 DIN EN 61967-6:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008
- 0000 DIN IEC 61967-6/A1:2005
