IEC 60512-16-1:2008
Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage

Standard No.

IEC 60512-16-1:2008

Release Date

2008

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 60512-16-1:2008

Replace

IEC 48B/1877/FDIS:2008 IEC 60512-8:1993

Scope

This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this part of IEC 60512 is to detail a standard test method to assess the effectiveness of the elastic system of contacts to resist damage from the insertion of a specified test probe. Although this test is intended for cylindrical contacts, the use for contacts with other geometries is not excluded. In which case, the detail specification should contain sufficient detail, given under the Clause 5 f), to enable the test to be done.

IEC 60512-16-1:2008 Referenced Document

• IEC 60512-1-1 Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination; Test 1a: Visual examination
• IEC 60512-16-5 Connectors for electronic equipment - Tests and measurements - Part 16-5: Mechanical tests on contacts and terminations - Test 16e: Gauge retention force (resilient contacts)*， 2008-07-01 Update

IEC 60512-16-1:2008 history

• 2008 IEC 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage

IEC 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage has been changed from IEC 60512-8:1993 Electromechanical components for electronic equipment; basic testing procedures and measuring methods; part 8: connector tests (mechanical) and mechanical tests on contacts and terminations.