ASTM F1263-99
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

Standard No.

ASTM F1263-99

Release Date

1999

Published By

American Society for Testing and Materials (ASTM)

Status

Be replaced

Replace By

ASTM F1263-99(2005)

Latest

ASTM F1263-11(2019)

Scope

1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary though exact knowledge may be replaced by over-conservative estimates of this distribution.

ASTM F1263-99 history

• 2019 ASTM F1263-11(2019) Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
• 2011 ASTM F1263-11 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
• 1999 ASTM F1263-99(2005) Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
• 1999 ASTM F1263-99 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts