ASTM F1996-06
Standard Test Method for Silver Migration for Membrane Switch Circuitry

Standard No.
ASTM F1996-06
Release Date
2006
Published By
American Society for Testing and Materials (ASTM)
Status
Replace By
ASTM F1996-14
Latest
ASTM F1996-14
Scope

The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.

Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).

1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.

1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.

ASTM F1996-06 history

  • 2014 ASTM F1996-14 Standard Test Method for Silver Migration for Membrane Switch Circuitry
  • 2006 ASTM F1996-06 Standard Test Method for Silver Migration for Membrane Switch Circuitry
  • 2001 ASTM F1996-01 Standard Test Method for Silver Migration for Membrane Switch Circuitry
  • 2000 ASTM F1996-00 Standard Test Method for Silver Migration for Membrane Switch Circuitry



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