ASTM F676-97
Standard Test Method for Measuring Unsaturated TTL Sink Current

Standard No.

ASTM F676-97

Release Date

1997

Published By

American Society for Testing and Materials (ASTM)

Status

Be replaced

Replace By

ASTM F676-97(2003)

Latest

ASTM F676-97(2003)

Scope

1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ASTM F676-97 history

• 1997 ASTM F676-97(2003) Standard Test Method for Measuring Unsaturated TTL Sink Current
• 1997 ASTM F676-97 Standard Test Method for Measuring Unsaturated TTL Sink Current