DIN EN 60749-8:2003
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing (IEC 60749-8:2002 + Corr. 1:2003 + Corr. 2:2003); German version EN 60749-8:2003

Standard No.

DIN EN 60749-8:2003

Release Date

2003

Published By

German Institute for Standardization

Status

Be replaced

Replace By

DIN EN 60749-8:2003-12

Latest

DIN EN 60749-8:2003-12

Replace

DIN EN 60749:2002

Scope

The project is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test method is to determine the leak rate of semiconductor devices.

DIN EN 60749-8:2003 history

• 2018 DIN EN 60749-3:2018 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017
• 2003 DIN EN 60749-3:2003 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection (IEC 60749-3:2002); German version EN 60749-3:2002
• 0000 DIN EN 60749:2002