BS EN 61000-4-20:2003 Electromagnetic compatibility (EMC) — Part 4-20: Testing and measurement techniques — Emission and immunity testing in transverse electromagnetic (TEM) waveguides
This part of IEC 61000 relates to emission and immunity test methods for electrical and
electronic equipment using various types of transverse electromagnetic (TEM) waveguides.
This includes open (for example, striplines and EMP simulators) and closed (for example,
TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM
waveguides. The frequency range depends on the specific testing requirements and the
specific TEM waveguide type.
The object of this standard is to describe
? TEM waveguide characteristics, including typical frequency ranges and EUT-size
limitations;
? TEM waveguide validation methods for EMC measurements;
? the EUT (i.e. EUT cabinet and cabling) definition;
? test set-ups, procedures, and requirements for radiated emission testing in TEM
waveguides and
? test set-ups, procedures, and requirements for radiated immunity testing in TEM
waveguides.
BS EN 61000-4-20:2003 history
2011BS EN 61000-4-20:2011 Electromagnetic compatibility (EMC). Testing and measurement techniques. Emission and immunity testing in transverse electromagnetic (TEM) waveguides
2011BS EN 61000-4-20:2010 Electromagnetic compatibility (EMC). Testing and measurement techniques. Emission and immunity testing in transverse electromagnetic (TEM) waveguides
2003BS EN 61000-4-20:2003 Electromagnetic compatibility (EMC) — Part 4-20: Testing and measurement techniques — Emission and immunity testing in transverse electromagnetic (TEM) waveguides