DIN EN 60749-5:2003
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003); German version EN 60749-5:2003

Standard No.

DIN EN 60749-5:2003

Release Date

2003

Published By

German Institute for Standardization

Status

Be replaced

Replace By

DIN EN 60749-5:2018

DIN EN 60749-5 E:2016

Latest

DIN EN 60749-5:2018

DIN EN 60749-5:2018-01

Replace

DIN EN 60749:2002 DIN EN 60749-5:2002

Scope

This part of DIN EN 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

DIN EN 60749-5:2003 history

• 2018 DIN EN 60749-5:2018 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017); German version EN 60749-5:2017
• 2003 DIN EN 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003); German version EN 60749-5:2003
• 0000 DIN EN 60749-5:2002