This part of GB/T 22319 specifies a measuring fixture that can accurately measure the resonant frequency, resonant resistance and equivalent circuit parameters of leadless surface-mounted quartz crystal components. The measurement method adopts IEC 60444-4:1988 and IEC 60444-5: Zero phase technology specified in 1995. The equivalent circuit and applicable frequency range using this measuring fixture are given in the following clauses. In addition, this standard also applies to leadless crystal component enclosures in IEC 61240:1994. The equivalent circuit and electrical parameters of the fixture were measured based on IEC 60444-1:1986 and IEC 60444-4:1988. Load capacitance range is 10pF or higher. This standard also specifies the calibration of the measurement system and C-piece. This section is suitable for measuring fixtures that can accurately measure the resonant frequency, resonant resistance, parallel capacitance C, dynamic capacitance C and dynamic inductance L of quartz crystal components. Its frequency range is 1MHz ~ 150MHz, using automatic measurement based on IEC 60444-5:1995. Network Analyzer.
IEC 60444-8:2003 history
2016IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
2003IEC 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units