DIN 51001:2003
Testing of oxidic raw materials and basic materials - General bases of work for X-ray fluorescence method (XRF)

Standard No.
DIN 51001:2003
Release Date
2003
Published By
German Institute for Standardization
Status
Replace By
DIN 51001:2003-08
Latest
DIN 51001 Beiblatt 1:2010-05
Replace
DIN 51001-1:1983
Scope
This standard specifies methods for the preparation of test samples for XRF and for the determination of oxide content. It is applicable to testing of raw materials and materials with preferably oxidical composition except for products in accordance with DIN EN ISO 12677.

DIN 51001:2003 history

  • 2010 DIN 51001 Beiblatt 1:2010-05 Testing of oxidic raw materials and basic materials - General bases of work for X-Ray fluorescence method (XRF) - General survey on disintegration methods referred to groups of materials for the determination of test specimens for XRF
  • 2010 DIN 51001 Bb.1:2010 Testing of oxidic raw materials and basic materials - General bases of work for X-Ray fluorescence method (XRF) - General survey on disintegration methods referred to groups of materials for the determination of test specimens for XRF
  • 2003 DIN 51001:2003-08 Testing of oxidic raw materials and basic materials - General bases of work for X-ray fluorescence method (XRF)
  • 2003 DIN 51001:2003 Testing of oxidic raw materials and basic materials - General bases of work for X-ray fluorescence method (XRF)
  • 0000 DIN 51001-1:1983
Testing of oxidic raw materials and basic materials - General bases of work for X-ray fluorescence method (XRF)



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