This standard specifies a common model framework for access network industrial equipment and provides a template for forming such a described, independent and used network. Note 1: The device description format specified in this standard is compatible with network devices accessed in bits and bytes. Each product standards technical committee shall use this standard to develop root device descriptions for their products. NOTE 2: Manufacturers or user organizations may apply the rules specified in this standard to develop "root device descriptions" for use within their own organizations. Product manufacturers shall characterize and describe their devices using the root device description developed by the Product Standards Technical Committee and the rules specified in this standard for creating manufacturer's device descriptions. This standard allows manufacturers to make specific extensions to the root device description developed by the Product Standards Technical Committee. If a suitable root device description is not available, manufacturers may develop their own device description using the rules specified in this standard. To facilitate the use of descriptions through network tools and application software in the future, this standard recommends the use of description interchange language to represent device description information. Note 3: The type of equipment referred to in this standard means simple equipment such as signal lights, buttons, and limit switch lights, or complex equipment with multi-byte information, such as motor controllers, semiconductor motor starters, etc.
IEC TS 61915:2003 history
2003IEC TS 61915:2003 Low-voltage switchgear and controlgear - Principles for the development of device profiles for networked industrial devices
IEC TS 61915:2003 Low-voltage switchgear and controlgear - Principles for the development of device profiles for networked industrial devices was changed to IEC 61915-1:2007 Low-voltage switchgear and controlgear - Device profiles for networked industrial devices - Part 1: General rules for the development of device profiles.