DIN EN 60749-10:2003
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock (IEC 60749-10:2002); German version EN 60749-10:2002

Standard No.

DIN EN 60749-10:2003

Release Date

2003

Published By

German Institute for Standardization

Status

Be replaced

Replace By

DIN EN 60749-10:2003-04

Latest

DIN EN 60749-10:2003-04

Replace

DIN EN 60749:2002

Scope

This part of DIN EN 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation or field operation.#,,#

DIN EN 60749-10:2003 history

• 2018 DIN EN 60749-3:2018 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017
• 2003 DIN EN 60749-3:2003 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection (IEC 60749-3:2002); German version EN 60749-3:2002
• 0000 DIN EN 60749:2002