DIN EN 60749-6:2003
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2002); German version EN 60749-6:2003

Standard No.

DIN EN 60749-6:2003

Release Date

2003

Published By

German Institute for Standardization

Status

Be replaced

Replace By

DIN EN 60749-6:2017

DIN EN 60749-6 E:2016

Latest

DIN EN 60749-6:2017-11

Replace

DIN EN 60749:2002

Scope

The purpose of this part of DIN EN 60749 is to test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably be used for device qualification.

DIN EN 60749-6:2003 history

• 2018 DIN EN 60749-3:2018 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017
• 2003 DIN EN 60749-3:2003 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection (IEC 60749-3:2002); German version EN 60749-3:2002
• 0000 DIN EN 60749:2002