This PAS applies to the phase jitter measurement of quartz crystal oscillators and SAW
oscillators used for electronic devices and gives guidance for phase jitter that allows the
accurate measurement of r.m.s. jitter.
In the measurement method, phase noise measurement equipment or a phase noise
measurement system is used.
The measuring frequency range is from 10 MHz to 700 MHz.
This PAS applies to quartz crystal oscillators and SAW oscillators used in electronic devices
and modules that have the multiplication or division functions based on these oscillators. The
type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text, these
oscillators and modules will be referred to as “oscillator(s)” for simplicity.
IEC PAS 60679-6:2008 history
2008IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide was changed to IEC 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide.